Please use this identifier to cite or link to this item:
http://hdl.handle.net/10263/2189| Title: | Studies on isomorphic-redundancy and testing of non-scan sequential circuits |
| Authors: | Das, Jaydeep |
| Keywords: | Isomorphic redundancy Non-scan sequential circuits |
| Issue Date: | 1992 |
| Publisher: | Indian Statistical Institute |
| Citation: | 42p. |
| Series/Report no.: | ;Diss-7 |
| Description: | M Tech |
| URI: | http://hdl.handle.net/10263/2189 |
| Appears in Collections: | Dissertations - M Tech (CS) |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| DISS-7.PDF | 677.34 kB | Adobe PDF | View/Open |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.