Please use this identifier to cite or link to this item: http://hdl.handle.net/10263/3055
Title: Zero-aliasing space compaction of test response using a single periodic output
Authors: Bhattacharya, Bhargab B
Gossel, Michael
Keywords: Space compaction
Stuck at faults
System-on a chip
Testing
Issue Date: 2003
Citation: IEEE transactions on computerrs,V52,P1646-1651
URI: http://hdl.handle.net/10263/3055
Appears in Collections:Computer Science

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