Please use this identifier to cite or link to this item:
http://hdl.handle.net/10263/3055
Title: | Zero-aliasing space compaction of test response using a single periodic output |
Authors: | Bhattacharya, Bhargab B Gossel, Michael |
Keywords: | Space compaction Stuck at faults System-on a chip Testing |
Issue Date: | 2003 |
Citation: | IEEE transactions on computerrs,V52,P1646-1651 |
URI: | http://hdl.handle.net/10263/3055 |
Appears in Collections: | Computer Science |
Files in This Item:
File | Description | Size | Format | |
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zero-aliasing.pdf | 191.67 kB | Adobe PDF | View/Open |
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