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http://hdl.handle.net/10263/4049
Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Bandyopadhyay, Sanghamitra | - |
dc.contributor.author | Pal, Sankar K | - |
dc.contributor.author | Murthy, C A | - |
dc.date.accessioned | 2012-05-15T16:12:39Z | - |
dc.date.available | 2012-05-15T16:12:39Z | - |
dc.date.issued | 1998 | - |
dc.identifier.citation | Information sciences,V109,P165-184 | en_US |
dc.identifier.uri | http://hdl.handle.net/10263/4049 | - |
dc.language.iso | en | en_US |
dc.subject | Pattern recognition | en_US |
dc.subject | Evolutionary computation | en_US |
dc.subject | Genetic algorithms | en_US |
dc.subject | Bayes | en_US |
dc.subject | Error probability | en_US |
dc.title | Simulated annealing based pattern classification | en_US |
dc.type | Article | en_US |
Appears in Collections: | Electronics |
Files in This Item:
File | Description | Size | Format | |
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simulated anneling.pdf | 909 kB | Adobe PDF | View/Open |
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