Please use this identifier to cite or link to this item:
http://hdl.handle.net/10263/4049| Title: | Simulated annealing based pattern classification |
| Authors: | Bandyopadhyay, Sanghamitra Pal, Sankar K Murthy, C A |
| Keywords: | Pattern recognition Evolutionary computation Genetic algorithms Bayes Error probability |
| Issue Date: | 1998 |
| Citation: | Information sciences,V109,P165-184 |
| URI: | http://hdl.handle.net/10263/4049 |
| Appears in Collections: | Electronics |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| simulated anneling.pdf | 909 kB | Adobe PDF | View/Open |
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