Please use this identifier to cite or link to this item: http://hdl.handle.net/10263/5874
Title: Optimum sampling plan for detection of independent defect categories in case of defect inteference
Authors: Dutta, Tridib K
Mukherjee, S P
Keywords: Optimum sampling plan
Defect inteference
Detection of independent defect categories
Issue Date: 1997
Citation: IAPQR Transactions, v 22, no 1, p 63-80
URI: http://hdl.handle.net/10263/5874
Appears in Collections:Mathematics and Statistics

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