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Please use this identifier to cite or link to this item: http://hdl.handle.net/10263/5874
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dc.contributor.authorDutta, Tridib K-
dc.contributor.authorMukherjee, S P-
dc.date.accessioned2014-03-27T12:59:24Z-
dc.date.available2014-03-27T12:59:24Z-
dc.date.issued1997-
dc.identifier.citationIAPQR Transactions, v 22, no 1, p 63-80en_US
dc.identifier.urihttp://hdl.handle.net/10263/5874-
dc.language.isoenen_US
dc.subjectOptimum sampling planen_US
dc.subjectDefect inteferenceen_US
dc.subjectDetection of independent defect categoriesen_US
dc.titleOptimum sampling plan for detection of independent defect categories in case of defect inteferenceen_US
dc.typeArticleen_US
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