Please use this identifier to cite or link to this item: http://hdl.handle.net/10263/5920
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dc.contributor.authorBhattacharya, Bhargab B-
dc.contributor.authorGupta, B-
dc.contributor.authorSarkar, S-
dc.contributor.authorChoudhury, A K-
dc.date.accessioned2014-06-13T10:12:31Z-
dc.date.available2014-06-13T10:12:31Z-
dc.date.issued1985-
dc.identifier.citationIEE Proceedings, V.132. No.3, P 155-162en_US
dc.identifier.urihttp://hdl.handle.net/10263/5920-
dc.language.isoenen_US
dc.subjectNetworksen_US
dc.subjectLogicen_US
dc.subjectFault locationen_US
dc.subjectTestable designen_US
dc.titleTestable design of RMC networks with at and bridging faultsen_US
dc.typeArticleen_US
Appears in Collections:Computer Science

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