Please use this identifier to cite or link to this item:
http://hdl.handle.net/10263/5920
Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Bhattacharya, Bhargab B | - |
dc.contributor.author | Gupta, B | - |
dc.contributor.author | Sarkar, S | - |
dc.contributor.author | Choudhury, A K | - |
dc.date.accessioned | 2014-06-13T10:12:31Z | - |
dc.date.available | 2014-06-13T10:12:31Z | - |
dc.date.issued | 1985 | - |
dc.identifier.citation | IEE Proceedings, V.132. No.3, P 155-162 | en_US |
dc.identifier.uri | http://hdl.handle.net/10263/5920 | - |
dc.language.iso | en | en_US |
dc.subject | Networks | en_US |
dc.subject | Logic | en_US |
dc.subject | Fault location | en_US |
dc.subject | Testable design | en_US |
dc.title | Testable design of RMC networks with at and bridging faults | en_US |
dc.type | Article | en_US |
Appears in Collections: | Computer Science |
Files in This Item:
File | Description | Size | Format | |
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IP-132-3-1985-P155-162.pdf | 2.91 MB | Adobe PDF | View/Open |
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