Please use this identifier to cite or link to this item:
http://hdl.handle.net/10263/6374| Title: | Tree-based hybrid scan architecture for VLSI testing |
| Authors: | Lahiri, Subhra |
| Keywords: | Hybrid scan DFT Energy/power reduction ISCAS-89 |
| Issue Date: | 2007 |
| Publisher: | Indian Statistical Institute, Kolkata |
| Citation: | 44p. |
| Series/Report no.: | Dissertation;2007-211 |
| Description: | Dissertation under the supervision of Prof. Bhargab B. Bhattacharya |
| URI: | http://hdl.handle.net/10263/6374 |
| Appears in Collections: | Dissertations - M Tech (CS) |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| Diss-211.pdf | Dissertation is the original PDF | 478.08 kB | Adobe PDF | View/Open |
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