Generalized euler number and related features for gray level image characterization
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Date
2000
Authors
Journal Title
Journal ISSN
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Publisher
Indian Statistical Institute, Kolkata
Abstract
Description
Dissertation under the supervision of Prof. Dr. Bhargab B. Bhattacharya, ACM Unit
Keywords
VLSI, CEN, VEN, DWGV, Gray-level diffusion
Citation
45p.