Characterizing Noise in IBM-Q Devices using Unitarity Randomized Benchmarking

dc.contributor.authorChandrashekar, Adarsh
dc.date.accessioned2021-05-11T06:18:08Z
dc.date.available2021-05-11T06:18:08Z
dc.date.issued2020-07
dc.descriptionDissertation under the supervision of Dr. Goutam Paul
dc.identifier.citation65p.en_US
dc.identifier.urihttp://hdl.handle.net/10263/7145
dc.language.isoenen_US
dc.publisherIndian Statistical Institute, Kolkataen_US
dc.relation.ispartofseriesDissertation;;2020-3
dc.subjectQuantum Computingen_US
dc.subjectRandomized Benchmarkingen_US
dc.titleCharacterizing Noise in IBM-Q Devices using Unitarity Randomized Benchmarkingen_US
dc.typeOtheren_US

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