Simulated annealing based pattern classification

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dc.contributor.authorBandyopadhyay, Sanghamitra
dc.contributor.authorPal, Sankar K
dc.contributor.authorMurthy, C A
dc.date.accessioned2012-05-15T16:12:39Z
dc.date.available2012-05-15T16:12:39Z
dc.date.issued1998
dc.identifier.citationInformation sciences,V109,P165-184en_US
dc.identifier.urihttp://hdl.handle.net/10263/4049
dc.language.isoenen_US
dc.subjectPattern recognitionen_US
dc.subjectEvolutionary computationen_US
dc.subjectGenetic algorithmsen_US
dc.subjectBayesen_US
dc.subjectError probabilityen_US
dc.titleSimulated annealing based pattern classificationen_US
dc.typeArticleen_US

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