Zero-aliasing space compaction of test response using a single periodic output

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dc.contributor.authorBhattacharya, Bhargab B
dc.contributor.authorGossel, Michael
dc.date.accessioned2012-01-24T17:45:06Z
dc.date.available2012-01-24T17:45:06Z
dc.date.issued2003
dc.identifier.citationIEEE transactions on computerrs,V52,P1646-1651en_US
dc.identifier.urihttp://hdl.handle.net/10263/3055
dc.language.isoenen_US
dc.subjectSpace compactionen_US
dc.subjectStuck at faultsen_US
dc.subjectSystem-on a chipen_US
dc.subjectTestingen_US
dc.titleZero-aliasing space compaction of test response using a single periodic outputen_US
dc.typeArticleen_US

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