Testing of stuck-open faults in generalized reedmuller and EXOR sum of products CMOS circuits

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dc.contributor.authorRahaman, H
dc.contributor.authorDas, D K
dc.contributor.authorBhattacharya, Bhargab B
dc.date.accessioned2012-01-24T18:42:42Z
dc.date.available2012-01-24T18:42:42Z
dc.date.issued2004
dc.identifier.citationIEEE proceedings of computers and digital techniques,V151,P83-93en_US
dc.identifier.urihttp://hdl.handle.net/10263/3060
dc.language.isoenen_US
dc.subjectEXORen_US
dc.subjectCMOS circuitsen_US
dc.titleTesting of stuck-open faults in generalized reedmuller and EXOR sum of products CMOS circuitsen_US
dc.typeArticleen_US

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