Dutta, Tridib KMukherjee, S P2014-03-272014-03-271997IAPQR Transactions, v 22, no 1, p 63-80http://hdl.handle.net/10263/5874enOptimum sampling planDefect inteferenceDetection of independent defect categoriesOptimum sampling plan for detection of independent defect categories in case of defect inteferenceArticle