Bhattacharya, Bhargab BGupta, BSarkar, SChoudhury, A K2014-06-132014-06-131985IEE Proceedings, V.132. No.3, P 155-162http://hdl.handle.net/10263/5920enNetworksLogicFault locationTestable designTestable design of RMC networks with at and bridging faultsArticle