On the detection of missing gate faults in reversible circuits by a universal test set

Rahaman, HKole, D KDas, D KBhattacharya, Bhargab B2011-08-112011-08-112008Proceedings of 21st international conference on VLSI design,P163-168http://hdl.handle.net/10263/2493enMissing gate faultsQuantum computingReversible logicTestable designUniversal test setOn the detection of missing gate faults in reversible circuits by a universal test setArticle