Zero-aliasing space compaction of test response using a single periodic output

Bhattacharya, Bhargab BGossel, Michael2012-01-242012-01-242003IEEE transactions on computerrs,V52,P1646-1651http://hdl.handle.net/10263/3055enSpace compactionStuck at faultsSystem-on a chipTestingZero-aliasing space compaction of test response using a single periodic outputArticle