Data depth and distribution-free discriminant analysis using separating surfaces

Ghosh, A KChaudhuri, P2012-01-012012-01-012005Bemoulli,V11,P1-27http://hdl.handle.net/10263/2680enBayes riskElliptic symmetryGeneralized U statisticsHalf-space depthLinear discriminant analysisLocation shift modelsMisclassification ratesOptimal bayes classifierQuadratic discriminant analysisRegression depthRobustnessVapnik chervonenkis dimensionData depth and distribution-free discriminant analysis using separating surfacesArticle