Banerjee, SRoychowdhury, DBhattacharya, Bhargab B2011-08-042011-08-042007IEEE transaction on pattern analysis and machine intelligence,V29,9,P1590-1602http://hdl.handle.net/10263/2293enDesign for testabilityScan pathSpace compactionStuck at faultsTestingVery large scale integrationAn efficient scan tree design for compact test pattern setArticle