Bandyopadhyay, SanghamitraBagchi, AdityaMaulik, Ujjwal2012-01-042012-01-042005IEEE transaction on knowledge and data engineering,V17,P479-490http://hdl.handle.net/10263/2821enPattern recognitionFuzzy clusteringCluster validity indexDetermining the number of clustersReversible jump Markov chain Monte CarloSimulated annealingRemote sensingSimulated annealing using reversible jump markov chain monte carlo algorithm for fuzzy clusteringArticle