Tree-based hybrid scan architecture for VLSI testing

Lahiri, Subhra2016-07-062016-07-06200744p.http://hdl.handle.net/10263/6374Dissertation under the supervision of Prof. Bhargab B. BhattacharyaenHybrid scanDFTEnergy/power reductionISCAS-89Tree-based hybrid scan architecture for VLSI testingThesis