Ghosh, A KChaudhuri, P2012-01-012012-01-012005Scandinavian Journal of stastics,V32,P327-350http://hdl.handle.net/10263/2682enBayes riskCross validationData depthElliptic symmetryKernel density estimationLocation shift modelsMahalanobis distanceMisclassification ratesVapnik chervonenkis dimensionOn maximum depth and related classifiersArticle