Chakraborty, T K2012-12-192012-12-191992Sankhya : The Indian Journal of Statistics, v 54, no. 2, p 242-248http://hdl.handle.net/10263/5107enSingle sampling attribute planLot tolerence percent defectivePoisson caseStochastic programmingChance consistraintKataoka's problemDeterministic equivalentSingle sampling LTPD plans as a stochastic programming problemArticle