Rahaman, HDas, D KBhattacharya, Bhargab BDas, S K2011-09-192011-09-192006Journal of electronic testing - theory and applicationsV22,2,P125-142http://hdl.handle.net/10263/2575enSymmetric functionsHierarchicalMapping symmetric functions to hiererchical modules for path-delay fault testabilityArticle