Rahaman, HDas, D KBhattacharya, Bhargab B2012-01-242012-01-242004IEEE proceedings of computers and digital techniques,V151,P83-93http://hdl.handle.net/10263/3060enEXORCMOS circuitsTesting of stuck-open faults in generalized reedmuller and EXOR sum of products CMOS circuitsArticle