Bandyopadhyay, UttamDas, RadhakantaBiswas, Atanu2012-11-022012-11-022003Sequential Analysis,v.22,no.1&2,p.75-93http://hdl.handle.net/10263/4677enFixed width confidence intervalPartial sequential sampling schemeWiener processAsymptotic relative efficiencyFixed width confidence interval of P ( X < Y ) in partial sequential sampling schemeArticle