Studies on Diagnostic Coverage and X-Sensitivity in Logic Circuits
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Date
2020-04
Authors
Journal Title
Journal ISSN
Volume Title
Publisher
Indian Statistical Institute, Kolkata
Abstract
Description
Thesis is under the supervision of Prof. Bhargab B. Bhattacharya
Keywords
X-Sensitivity, LogicCircuits, Combinatorial Approaches, Machine Learning Approaches
Citation
152p.